发明名称 FinFET device with gate electrode and spacers
摘要 A semiconductor device includes a source region, a drain region, and a fin that connects the source region to the drain region. A gate electrode having a substantially planar surface overlies the fin and is positioned between the drain region and the source region. A first set of spacers is positioned between a first sidewall of the gate electrode and the source region and between a second sidewall of the gate electrode and the drain region. A second set of spacers is positioned on at least a portion of a top surface of the source region and the drain region and alongside at least a portion of the first set of spacers. At least a portion of sidewalls of the second set of spacers contacts a portion of the first or second sidewall of the gate electrode.
申请公布号 US7679135(B2) 申请公布日期 2010.03.16
申请号 US20090349062 申请日期 2009.01.06
申请人 INFINEON TECHNOLOGIES AG 发明人 SCHULZ THOMAS
分类号 H01L29/772 主分类号 H01L29/772
代理机构 代理人
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