发明名称 Semiconductor active region of TFTs having radial crystal grains through the whole area of the region
摘要 There is disclosed a method of fabricating a thin-film transistor having excellent characteristics. Nickel element is held in contact with selected regions of an amorphous silicon film. Then, thermal processing is performed to crystallize the amorphous film. Subsequently, thermal processing is carried out in an oxidizing ambient containing a halogen element to form a thermal oxide film. At this time, the crystallinity is improved. Also, gettering of the nickel element proceeds. This crystalline silicon film consists of crystals grown radially from a number of points. Consequently, the thin-film transistor having excellent characteristics can be obtained.
申请公布号 US7679087(B2) 申请公布日期 2010.03.16
申请号 US20020214691 申请日期 2002.08.09
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 YAMAZAKI SHUNPEI;TERAMOTO SATOSHI;KOYAMA JUN;OGATA YASUSHI;HAYAKAWA MASAHIKO;OSAME MITSUAKI;OHTANI HISASHI;HAMATANI TOSHIJI
分类号 H01L21/20;H01L29/04;H01L21/00;H01L21/02;H01L21/28;H01L21/322;H01L21/324;H01L21/336;H01L21/77;H01L21/84;H01L27/12;H01L29/00;H01L29/02;H01L29/49;H01L29/786;H01L31/0392 主分类号 H01L21/20
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