发明名称 Strengthening of a structure by infiltration
摘要 The present invention provides a method of strengthening a structure, to heal the imperfection of the structure, to reinforce the structure, and thus strengthening the dielectric without compromising the desirable low dielectric constant of the structure. The inventive method includes the steps of providing a semiconductor structure having at least one interconnect structure; dicing the interconnect structure; applying at least one infiltrant into the interconnect structure; and infiltrating the infiltrant to infiltrate into the interconnect structure.
申请公布号 US7678673(B2) 申请公布日期 2010.03.16
申请号 US20070832368 申请日期 2007.08.01
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 HUANG ELBERT;LANDERS WILLIAM F.;LANE MICHAEL;LINIGER ERIC G.;LIU XIAO H.;QUESTAD DAVID L.;SHAW THOMAS M.
分类号 B05D3/12;B05D3/06 主分类号 B05D3/12
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