发明名称 Double stage charged particle beam energy width reduction system for charged particle beam system
摘要 The present invention relates to e.g. a charged particle beam energy width reduction system for a charged particle beam with a z-axis along the optical axis and a first and a second plane, comprising, a first element acting in a focusing and dispersive manner, a second element acting in a focusing and dispersive manner, a first quadrupole element being positioned such that, in operation, a field of the first quadrupole element overlaps with a field of the first element acting in a focusing and dispersive manner, a second quadrupole element being positioned such that, in operation, a field of the second quadrupole element overlaps with a field of the second element acting in a focusing and dispersive manner, a first charged particle selection element being positioned, in beam direction, before the first element acting in a focusing and dispersive manner, and a second charged particle selection element being positioned, in beam direction, after the first element acting in a focusing and dispersive manner. Thereby, a virtually dispersive source-like location without an inherent dispersion limitation can be realized.
申请公布号 US7679054(B2) 申请公布日期 2010.03.16
申请号 US20040571347 申请日期 2004.09.02
申请人 ICT INTEGRATED CIRCUIT TESTING GESELLSCHAFT FUER HALBLEITERPRUEFTECHNIK MBH 发明人 FROSIEN JUERGEN;DEGENHARDT RALF;LANIO STEFAN
分类号 H01J49/00;H01J37/05;H01J37/153;H01J37/28;H01J49/28;H01J49/46 主分类号 H01J49/00
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