发明名称 Image processing method, substrate inspection method, substrate inspection apparatus and method of generating substrate inspection data
摘要 A color image as a combination of color data corresponding to a plural n-number of different hues is processed by extracting a target object from the image and carrying out a specified image processing. A reference image is obtained in the absence of the target object. Color data corresponding to specified less than n of the different hues are considered and difference in the degree of intensity of the considered color data relative to the combination of color data corresponding to n different hues between each pixel of the target image containing the target object and a corresponding pixel on the reference image are extracted. Pixels for which the extracted difference is greater than a specified threshold value and is in a specified direction are extracted. An image area formed by the extracted pixels are recognized as the target object.
申请公布号 US7680320(B2) 申请公布日期 2010.03.16
申请号 US20050317415 申请日期 2005.12.22
申请人 OMRON CORPORATION 发明人 MURAKAMI KIYOSHI;ISHIBA MASATO;YOTSUYA TERUHISA
分类号 G06K9/00 主分类号 G06K9/00
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