发明名称 |
Image processing method, substrate inspection method, substrate inspection apparatus and method of generating substrate inspection data |
摘要 |
A color image as a combination of color data corresponding to a plural n-number of different hues is processed by extracting a target object from the image and carrying out a specified image processing. A reference image is obtained in the absence of the target object. Color data corresponding to specified less than n of the different hues are considered and difference in the degree of intensity of the considered color data relative to the combination of color data corresponding to n different hues between each pixel of the target image containing the target object and a corresponding pixel on the reference image are extracted. Pixels for which the extracted difference is greater than a specified threshold value and is in a specified direction are extracted. An image area formed by the extracted pixels are recognized as the target object.
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申请公布号 |
US7680320(B2) |
申请公布日期 |
2010.03.16 |
申请号 |
US20050317415 |
申请日期 |
2005.12.22 |
申请人 |
OMRON CORPORATION |
发明人 |
MURAKAMI KIYOSHI;ISHIBA MASATO;YOTSUYA TERUHISA |
分类号 |
G06K9/00 |
主分类号 |
G06K9/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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