发明名称 Crystal oscillator tester
摘要 A crystal oscillator tester includes first and second test pins, first and second transistors, an indicator, a first diode, and first-third capacitors. The first test pin is connected to a power source. The collector of the first transistor is connected to the first test pin. The base of the second transistor is connected to the second test pin. The emitter of the first transistor is grounded via the indicator. The base of the first transistor is connected to the cathode of the first diode. The anode of the first diode is connected to the first test pin via the first and second capacitors one by one in series. The emitter of the second transistor is connected to a node between the first and second capacitors. The collector of the second transistor is grounded. The third capacitor is connected between the base and emitter of the second transistor.
申请公布号 US7679460(B2) 申请公布日期 2010.03.16
申请号 US20080212659 申请日期 2008.09.18
申请人 HONG FU JIN PRECISION INDUSTRY (SHENZHEN) CO., LTD.;HON HAI PRECISION INDUSTRY CO., LTD. 发明人 CAO XIANG
分类号 H03B1/00;G01R23/00;G01R29/22 主分类号 H03B1/00
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