发明名称 POLIERKISSEN ZUM CHEMISCH-MECHANISCHEN POLIEREN VON SUBSTRATEN IN GEGENWART VON SCHLEIFPARTIKELN ENTHALTENDE AUFSCHLÄMMUNG
摘要 <p>A polishing pad (10) for polishing semiconductors and other planar substrates in the presence of a slurry comprising abrasive particles and a dispersive agent is disclosed. The polishing pad (10) includes a soluble component (14), preferably fibrous, within a polymer matrix component (16). The fibrous component (14) includes fibers soluble in the slurry sufficiently to provide a void structure in the polishing surface (20) of the pad (10). The void structure enhances the polishing rate and uniformity by increasing the mobility of the abrasive particles while reducing scratching of the polished surface. Additives that further enhance polishing and/or assist in the removal of residues generated during polishing, such as surfactants and removers, are optionally incorporated in the fibrous substance or topographically coated on the fibrous substance. <IMAGE></p>
申请公布号 AT459453(T) 申请公布日期 2010.03.15
申请号 AT20000850065T 申请日期 2000.04.12
申请人 INNOPAD, INC. 发明人 HSU, OSCAR K.;VANGSNESS, JEAN K.;BILLINGS, SCOTT C.;GILBRIDE, DAVID S.
分类号 B24D13/12;B24B37/22;B24B37/24;B24D13/14;H01L21/304;H01L21/306 主分类号 B24D13/12
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