MEMORY TEST SYSTEM COMPRISING AUTOMATIC ADDRESS SETTING FUNCTION

摘要

PURPOSE: A memory test system comprising an automatic address setting function are provided to reduce a test time by automatically assigning the address of each sub-tester from a identifying unit. CONSTITUTION: In a memory test system comprising an automatic address setting function, a main tester(100) generates test data and a sub tester(200) receives test data from the main tester. The main tester applies the received test data to a test memory and tests the memory. An identification unit(400) generates identifier for distinguish the sub tester.