发明名称 |
LITHOGRAPHIC APPARATUS AND ALIGNMENT METHOD. |
摘要 |
An alignment method for a substrate or a patterning device is disclosed along with a corresponding apparatus. The method includes using a part of an alignment arrangement of a lithographic apparatus to undertake a part of an alignment procedure on a part of a substrate or on a part of a patterning device, until the substrate or a part of or in the lithographic apparatus, has become thermally stabilized within a limit. |
申请公布号 |
NL2003339(A) |
申请公布日期 |
2010.03.15 |
申请号 |
NL20092003339 |
申请日期 |
2009.08.10 |
申请人 |
ASML NETHERLANDS B.V., |
发明人 |
VOZNYI, OLEG;ONVLEE, JOHANNES;BERGE, PETER TEN |
分类号 |
G03F7/20;G03F9/00 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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