发明名称 LITHOGRAPHIC APPARATUS AND ALIGNMENT METHOD.
摘要 An alignment method for a substrate or a patterning device is disclosed along with a corresponding apparatus. The method includes using a part of an alignment arrangement of a lithographic apparatus to undertake a part of an alignment procedure on a part of a substrate or on a part of a patterning device, until the substrate or a part of or in the lithographic apparatus, has become thermally stabilized within a limit.
申请公布号 NL2003339(A) 申请公布日期 2010.03.15
申请号 NL20092003339 申请日期 2009.08.10
申请人 ASML NETHERLANDS B.V., 发明人 VOZNYI, OLEG;ONVLEE, JOHANNES;BERGE, PETER TEN
分类号 G03F7/20;G03F9/00 主分类号 G03F7/20
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