| 摘要 |
A handler, method of transferring test-tray, and method of manufacturing semiconductor are provided to save the cost of the semiconductor device. The test tray(100) comprises the connection unit(101), and the connection part(102) and the socket(103). The connection unit is formed in the side of the test tray. The connection unit is connected to the Hifix board. The connection unit comprises a plurality of interface pins corresponding to the number of semiconductor devices accepted in the test tray. The Hifix board is electrically connected through interface pins to semiconductor devices. The connection part electrically connects the semiconductor device and the connection unit accepted in the socket. The socket receives the semiconductor device. |
