发明名称 SEMICONDUCTOR DEVICE MANUFACTURING METHOD AND SUBSTRATE TREATMENT DEVICE
摘要 It is possible to suppress initial oxidization of a substrate surface before oxidization treatment and remove a naturally oxidized film. The method includes a step for introducing a substrate into a treatment chamber, a step for supplying a gas containing oxygen and a gas containing hydrogen into the treatment chamber for oxidizing the surface of the substrate, and a step for carrying the substrate after the oxidization from the treatment chamber. In the oxidization step, the pressure in the treatment chamber is lowered than the atmospheric pressure. The hydrogen-containing gas is introduced firstly into the treatment chamber and then oxygen-containing gas is introduced while maintaining introduction of the hydrogen-containing gas.
申请公布号 KR20100028663(A) 申请公布日期 2010.03.12
申请号 KR20107002353 申请日期 2006.03.08
申请人 HITACHI KOKUSAI ELECTRIC INC. 发明人 YUASA KAZUHIRO;MEGAWA YASUHIRO
分类号 H01L21/205;H01L21/02;H01L21/31 主分类号 H01L21/205
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