发明名称 |
SEMICONDUCTOR DEVICE MANUFACTURING METHOD AND SUBSTRATE TREATMENT DEVICE |
摘要 |
It is possible to suppress initial oxidization of a substrate surface before oxidization treatment and remove a naturally oxidized film. The method includes a step for introducing a substrate into a treatment chamber, a step for supplying a gas containing oxygen and a gas containing hydrogen into the treatment chamber for oxidizing the surface of the substrate, and a step for carrying the substrate after the oxidization from the treatment chamber. In the oxidization step, the pressure in the treatment chamber is lowered than the atmospheric pressure. The hydrogen-containing gas is introduced firstly into the treatment chamber and then oxygen-containing gas is introduced while maintaining introduction of the hydrogen-containing gas.
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申请公布号 |
KR20100028663(A) |
申请公布日期 |
2010.03.12 |
申请号 |
KR20107002353 |
申请日期 |
2006.03.08 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC. |
发明人 |
YUASA KAZUHIRO;MEGAWA YASUHIRO |
分类号 |
H01L21/205;H01L21/02;H01L21/31 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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