| 摘要 |
<P>PROBLEM TO BE SOLVED: To rapidly evaluate which probe pin increases its contact resistance in a plurality of probe pins of an IC socket. Ž<P>SOLUTION: A socket resistance evaluating device 50 is provided, which includes a controller 1, a contact resistance evaluating/determining section 2, a handler arm 3, a pressure sensor 4, a socket resistance evaluating jig 5, a socket housing 6, a socket 7 and a reception pin board 8. The socket resistance evaluating jig 5 includes a metal plate 10 and a plurality of semispherical projection parts 11. The contact resistance evaluating/determining section 2 which includes a constant current source 21, a decoder 22, a comparator 23, an ADC 24, a CPU 25, an interface 26, a switch SW1 and a switch SW2, measures a contact resistance between the projection part 11 of the socket resistance evaluating jig 5 and a pogo pin 9 used as a probe pin of the socket 7, determines whether the measured value meets a prescribed value, and outputs its result. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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