发明名称 X-RAY INSPECTION APPARATUS
摘要 PROBLEM TO BE SOLVED: To obtain an X-ray inspection apparatus capable of efficiently changing the setting of a reference value by providing a worker with an index when changing the setting of the reference value (threshold). SOLUTION: The X-ray inspection apparatus 1 includes a storage means 22 for storing a plurality of detection data S1 relating to intensity of X rays acquired by an X-ray detection section 5 by inspection relating to a plurality of articles 100, a setting means 24 for setting a hypothetical reference value different from an actual reference value used for inspection relating to the plurality of articles 100 as a prescribed reference value, a determining means 25 for determining whether a contaminant exists inside the respective articles 100 from a result of a comparison between the hypothetical reference value and respective detection data S1 stored in the storage means 22, a calculating means 26 for calculating a hypothetical contaminant mixture rate as a ratio of the number of articles 100 in which the determining means 25 has determined that a contaminant has been mixed with respect to a total number of plurality of articles 100, and a display control means 27 for displaying the hypothetical contaminant mixture rate on a display section 9. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010054380(A) 申请公布日期 2010.03.11
申请号 JP20080220434 申请日期 2008.08.28
申请人 ISHIDA CO LTD 发明人 KABUMOTO TAKASHI
分类号 G01N23/04 主分类号 G01N23/04
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