发明名称 METHOD OF DETECTING OR QUANTITATING ENDOGENOUS WHEAT DNA AND METHOD OF DETERMINING CONTAMINATION RATE OF GENETICALLY MODIFIED WHEAT IN TEST SAMPLE
摘要 An object of the present invention is to discover an endogenous wheat sequence satisfying the conditions of: a) it is universally present in varieties of wheat, b) the amount present (detected amount) is not affected depending on the wheat variety, c) even if other grains are present, only wheat can be detected without cross-reactivity, and d) it is amplified quantitatively by the PCR reaction. A further object of the present invention is to provide a method of accurately detecting and quantitating endogenous wheat DNA in a test sample by the polymerase chain reaction. The present invention provides a method of detecting or quantitating endogenous wheat DNA in a test sample by the polymerase chain reaction, the method comprising: a step of using a nucleic acid in the test sample or a nucleic acid extracted from the test sample as a template to amplify the nucleic acid of a region consisting of the base sequence identified as SEQ ID NO: 2 or a partial sequence thereof with a primer pair capable of amplifying that region; and a step of detecting or quantitating the amplified nucleic acid.
申请公布号 US2010062432(A1) 申请公布日期 2010.03.11
申请号 US20070300973 申请日期 2007.05.11
申请人 IMAI SHINJIRO;TANAKA KEIKO 发明人 IMAI SHINJIRO;TANAKA KEIKO
分类号 C12Q1/68;C07H21/04 主分类号 C12Q1/68
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