发明名称 |
INSULATING FILM FOR CAPACITOR, CAPACITOR ELEMENT, METHOD OF MANUFACTURING INSULATING FILM FOR CAPACITOR, AND SEMICONDUCTOR DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To attain high relative permittivity as an insulating film for a capacitor, also in a strontium titanate (STO) film which is thinned to nearly 10 nm. Ž<P>SOLUTION: The STO film is employed such that the spectrum ratio of strength (200)/(111) of a crystal plane orientation (200) to a spectrum of (111) measured with X-ray diffraction method exists in the range of 1.0-2.3. The STO film is acquired in such a way that after depositing titanium oxide (TiOx) film in a predetermined thickness, deposition of the STO film in an amorphous state is carried out, thus making the STO film into a crystallized state by heat treating in inactive gas atmosphere. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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申请公布号 |
JP2010056392(A) |
申请公布日期 |
2010.03.11 |
申请号 |
JP20080221491 |
申请日期 |
2008.08.29 |
申请人 |
ELPIDA MEMORY INC |
发明人 |
KIYOMURA TAKATOSHI;HIROTA TOSHIYUKI |
分类号 |
H01L21/8242;H01L21/316;H01L27/108 |
主分类号 |
H01L21/8242 |
代理机构 |
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