发明名称 INSPECTION DATA MANAGEMENT DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide an inspection data DB (Data Base) wherein each piece of inspection data and a measurement instrument measuring it are associated, and to prevent that a non-calibrated measurement instrument is erroneously used. <P>SOLUTION: An inspection data input terminal 1 reads measurement instrument identification information of the measurement instrument 4 from an IC (Integrated Circuits) tag 44 of the measurement instrument 4, reads the inspection data obtained by inspecting a product 5 from a measurement part 41, and transmits the inspection data and the measurement instrument identification information to this inspection data management device 2. The inspection data management device 2 receives the inspection data and the measurement instrument identification information, associates two sides with each other, and accumulates the two sides in the inspection data DB 22. The inspection data input terminal 1 acquires calibration validity term information of the measurement instrument 4 in reference to a calibration measurement instrument DB 24 of the inspection data management device 2 based on the measurement instrument identification information, and decides validity thereof. As a result, when the calibration validity term information expires, a warning of the calibration validity term expiration of the measurement instrument 4 is outputted, and input of the inspection data is invalidated. <P>COPYRIGHT: (C)2010,JPO&INPIT</p>
申请公布号 JP2010055643(A) 申请公布日期 2010.03.11
申请号 JP20090277919 申请日期 2009.12.07
申请人 HITACHI LTD 发明人 AOKI MASATAKA;KAZAMA HIDEAKI;YAMASHITA SHIHEI
分类号 G05B19/418;G06Q50/00;G06Q50/04 主分类号 G05B19/418
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