发明名称 System for Electrical Apparatus Testing
摘要 An easily implemented method of diagnosing both supply path, upstream, and load path, downstream, anomalies such as impedance events in machine or motor circuitry is accomplished by analyzing the across-the-line startup current and voltage time waveforms. No line of sight limitations exist and high accuracy exists. The techniques can be automated estimating poor contact resistance based on the voltage and current variation under a load change condition perhaps such as startup and/or shutdown of the load. Both, upstream and downstream problems from the point of voltage measurement can be monitored analyzing a load change condition. Additionally, downstream problems can be identified by using negative sequence current under steady state operation of the load.
申请公布号 US2010060289(A1) 申请公布日期 2010.03.11
申请号 US20080205816 申请日期 2008.09.05
申请人 SKF USA, INC. 发明人 WIEDENBRUG ERNESTO;LEE SANG BIN
分类号 G01R31/00 主分类号 G01R31/00
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