发明名称 SYSTEM AND METHOD FOR ESTIMATING THE JUNCTION TEMPERATURE OF A LIGHT EMITTING DIODE
摘要 A method of estimating the junction temperature of a light emitting diode comprises driving a forward bias current through the diode, the current comprising a square wave which toggles between high and low current values (Ihigh, lIow), the high current value (lh?gh) comprising an LED operation current, and the low current value (IIOW) comprising a non-zero measurement current. The forward bias voltage drop (Vf) is sampled and the forward bias voltage drop (VfIow) is determined at the measurement current (IIOW)- The temperature is derived from the determined forward bias voltage drop.
申请公布号 WO2009095853(A3) 申请公布日期 2010.03.11
申请号 WO2009IB50325 申请日期 2009.01.27
申请人 NXP B.V.;NGUYEN HOANG, VIET;SURDEANU, RADU;BANCKEN, PASCAL;BATAILLOU, BENOIT;VAN STEENWINCKEL, DAVID 发明人 NGUYEN HOANG, VIET;SURDEANU, RADU;BANCKEN, PASCAL;BATAILLOU, BENOIT;VAN STEENWINCKEL, DAVID
分类号 H05B33/08 主分类号 H05B33/08
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