| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor testing apparatus, capable of inputting a pulse signal which stands at specific potentials VH, VL, to a device under test even in the case that a pulse width of its test pattern becomes narrow. Ž<P>SOLUTION: The semiconductor testing apparatus which is equipped with a pattern generator for generating the test pattern and a driver circuit for generating/outputting a signal to be applied to an test object, based on the generated test pattern, includes: a pulse-width determining means for determining a pulse width of the signal which is output, on the basis of pattern data by the driver circuit; and a computing means for computing the compensation value which compensates an attenuated portion of the output signal caused by losses in a transmission line in accordance with the pulse width, if such a determination is made that the pulse width of the output signal from the driver circuit is shorter than the electrical length of the transmission line. In the semiconductor testing apparatus, a voltage which specifies an output potential on the high side, and a voltage which specifies the output potential on the low side, are generated based on the compensation value and first voltage level data or second voltage level data. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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