发明名称 DC TEST RESOURCE SHARING FOR ELECTRONIC DEVICE TESTING
摘要 A test system can include contact elements for making electrical connections with test points of a DUT. The test system can also include a DC test resource and a signal router, which can be configured to switch a DC channel from the DC test resource between individual contact elements in a group of contact elements.
申请公布号 WO2010008959(A3) 申请公布日期 2010.03.11
申请号 WO2009US49719 申请日期 2009.07.06
申请人 FORMFACTOR, INC.;HUEBNER, MICHAEL, W. 发明人 HUEBNER, MICHAEL, W.
分类号 G01R31/28;G01R31/3181;H01L21/66 主分类号 G01R31/28
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