发明名称 |
DC TEST RESOURCE SHARING FOR ELECTRONIC DEVICE TESTING |
摘要 |
A test system can include contact elements for making electrical connections with test points of a DUT. The test system can also include a DC test resource and a signal router, which can be configured to switch a DC channel from the DC test resource between individual contact elements in a group of contact elements. |
申请公布号 |
WO2010008959(A3) |
申请公布日期 |
2010.03.11 |
申请号 |
WO2009US49719 |
申请日期 |
2009.07.06 |
申请人 |
FORMFACTOR, INC.;HUEBNER, MICHAEL, W. |
发明人 |
HUEBNER, MICHAEL, W. |
分类号 |
G01R31/28;G01R31/3181;H01L21/66 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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