| 摘要 |
PURPOSE: A circuit and a method for measuring a driving resistance are provided to verify the reason for the Rtt mismatch of a semiconductor device by measuring the full-up driving resistance of a ZQ calibration circuit. CONSTITUTION: A ZQ pin is exposed to the outside of a semiconductor device in order to be connected to an external resistance. A calibration code generation unit generates a pre-set calibration code. A driving unit is connected to the ZQ pin. The driving unit drives the ZQ pin. A control unit(110) responds to the calibration code. In a pre-set test mode, the control unit controls the drive of the driving unit. The control unit measures the resistance of the driving unit. |
