发明名称 |
METHOD OF MANUFACTURING COMPOUND EPITAXIAL LAYER, AND SEMICONDUCTOR LAMINATE STRUCTURE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method of manufacturing a compound epitaxial layer that reduces formation of a droplet lowering the manufacturing yield and also has excellent crystallinity at the same time. Ž<P>SOLUTION: The present invention relates to the method of forming the compound epitaxial layer on a ZnO substrate. Crystal growth is carried out by supplying elements for forming the compound epitaxial layer, such that (a) a growth surface of the ZnO substrate has an angle of ≥10° to a ä0001} plane and (b) all or some of the elements for forming the compound epitaxial layer are intermittently supplied to the growth surface on the substrate under conditions of 1×10<SP>-6</SP>sec≤Toff≤1×10<SP>-2</SP>sec and 1×10<SP>-6</SP>sec≤Ton≤1×10<SP>-2</SP>, where Ton (sec) is an arbitrary supply duration in an intermittent supply sequence and Toff (sec) is a supply pause time up to next element supply. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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申请公布号 |
JP2010056435(A) |
申请公布日期 |
2010.03.11 |
申请号 |
JP20080222149 |
申请日期 |
2008.08.29 |
申请人 |
KANAGAWA ACAD OF SCI & TECHNOL;UNIV OF TOKYO;MITSUBISHI CHEMICALS CORP |
发明人 |
FUJIOKA HIROSHI;KOBAYASHI ATSUSHI;HORIE HIDEYOSHI;AMAUCHI HIDETAKA;NAGAO SATORU |
分类号 |
H01L21/203;C23C14/34 |
主分类号 |
H01L21/203 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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