发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND SUBSTRATE PROCESSING APPARATUS
摘要 PURPOSE: A method for manufacturing a semiconductor device and an apparatus for processing a substrate are provided to form a nitride silicon layer including excessive silicon by optimizing the composition ratio of silicon and nitrogen. CONSTITUTION: Dichlorosilane is applied to a substrate to form a silicon layer under a CVD reaction condition. Ammonia is applied to the substrate under a non-plasma atmosphere. Nitration is performed by the silicon layer and the ammonia. There is an insufficient amount of ammonia when thermal-nitration is performed on the silicon layer. A nitride silicon layer including excessive silicon is formed.
申请公布号 KR20100027989(A) 申请公布日期 2010.03.11
申请号 KR20090082135 申请日期 2009.09.01
申请人 HITACHI KOKUSAI ELECTRIC INC. 发明人 HIROSE YOSHIRO;TAKASAWA YUSHIN;KATO TOMOHIDE;AKAE NAONORI
分类号 H01L21/205 主分类号 H01L21/205
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