SEMICONDUCTOR MEMORY AND METHOD OF MANUFACTURING MEMORY CHIP

摘要

<P>PROBLEM TO BE SOLVED: To properly test a semiconductor memory even when the waveform of an input signal supplied to the semiconductor memory in a test is not normal. Ž<P>SOLUTION: The semiconductor memory includes a memory cell array and an input circuit which receives an input signal supplied from the outside to be stored in the memory cell array. The input circuit includes a glitch removal circuit supplied with the input signal on the basis of activation of a test mode signal. Even when the waveform of the input signal supplied to the semiconductor memory in the test is not normal, the semiconductor memory is tested correctly by removing a noise by the glitch removal circuit. When simultaneously testing a plurality of semiconductor memories, operation of a defective semiconductor memory is prevented from affecting the tests of the other semiconductor memories. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž