发明名称 SEMICONDUCTOR DEVICE HAVING VERTICAL FIELD EFFECT TRANSISTOR, AND MANUFACTURING METHOD THEREOF
摘要 <P>PROBLEM TO BE SOLVED: To further raise the integration degree of a semiconductor device using a vertical field effect transistor (FET). Ž<P>SOLUTION: The semiconductor device 1 includes an insulating substrate 10, a first semiconductor layer 21 of a first conductivity type formed on the insulating substrate 10, a first vertical FET (NFET) of a first conductivity type channel whose source or drain (one or the other) is formed on the first semiconductor layer 21, a second semiconductor layer 22 of a second conductivity type formed on the insulating substrate 10, and a second vertical FET (PFET) of a second conductivity type channel whose source or drain (one or the other) is formed on the second semiconductor layer 22. The first semiconductor layer 21 directly contacts the second semiconductor layer 22. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010056215(A) 申请公布日期 2010.03.11
申请号 JP20080218155 申请日期 2008.08.27
申请人 NEC ELECTRONICS CORP 发明人 TAKEUCHI KIYOSHI
分类号 H01L29/786;H01L21/3205;H01L21/768;H01L21/8238;H01L23/52;H01L27/04;H01L27/08;H01L27/092;H01L29/78 主分类号 H01L29/786
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