发明名称 |
DEVICE AND METHOD FOR TREATING SUBSTRATE |
摘要 |
PROBLEM TO BE SOLVED: To provide a device for treating a substrate improving substrate treatment efficiency. SOLUTION: The device 1 for treating the substrate includes: a rotating mechanism 5 holding and rotating a substrate W having a treatment object surface; a supply nozzle 6 for supplying a treatment liquid to the treatment object surface of the substrate W rotated by the rotating mechanism 5; a moving mechanism 7 sequentially moving the supply nozzle 6 to a plurality of supply positions arranged toward an edge of the substrate W; a detection part 8 detecting a surface condition change of the treatment object surface at a part with the treatment liquid supplied thereto by the supply nozzle 6; and a means to control the moving mechanism 7 so that the supply nozzle 6 moves to the next supply position when the surface condition change detected by the detection part 8 is set below an allowable value. COPYRIGHT: (C)2010,JPO&INPIT
|
申请公布号 |
JP2010056405(A) |
申请公布日期 |
2010.03.11 |
申请号 |
JP20080221709 |
申请日期 |
2008.08.29 |
申请人 |
SHIBAURA MECHATRONICS CORP |
发明人 |
HIROSE HARUMICHI;KIKUCHI TSUTOMU;KUROKAWA SADAAKI;NAGASHIMA YUJI |
分类号 |
H01L21/027;H01L21/304 |
主分类号 |
H01L21/027 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|