发明名称 DEVICE AND METHOD FOR TREATING SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To provide a device for treating a substrate improving substrate treatment efficiency. SOLUTION: The device 1 for treating the substrate includes: a rotating mechanism 5 holding and rotating a substrate W having a treatment object surface; a supply nozzle 6 for supplying a treatment liquid to the treatment object surface of the substrate W rotated by the rotating mechanism 5; a moving mechanism 7 sequentially moving the supply nozzle 6 to a plurality of supply positions arranged toward an edge of the substrate W; a detection part 8 detecting a surface condition change of the treatment object surface at a part with the treatment liquid supplied thereto by the supply nozzle 6; and a means to control the moving mechanism 7 so that the supply nozzle 6 moves to the next supply position when the surface condition change detected by the detection part 8 is set below an allowable value. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010056405(A) 申请公布日期 2010.03.11
申请号 JP20080221709 申请日期 2008.08.29
申请人 SHIBAURA MECHATRONICS CORP 发明人 HIROSE HARUMICHI;KIKUCHI TSUTOMU;KUROKAWA SADAAKI;NAGASHIMA YUJI
分类号 H01L21/027;H01L21/304 主分类号 H01L21/027
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