发明名称 Stacked structure for forming damascene structure
摘要 A method of fabricating a stacked structure for forming a damascene process is described. A doped dielectric layer is formed on a substrate. A surface treatment is performed to the dielectric layer to make the dopant concentration in an upper surface layer of the dielectric layer lower than that in the other portions of the dielectric layer. A metal hard mask is then formed on the dielectric layer. Since the dopant conc. in the upper surface layer of the dielectric layer is lowered, the reaction between the metal hard mask and the dopant in the dielectric layer can be inhibited.
申请公布号 US7675178(B2) 申请公布日期 2010.03.09
申请号 US20050322140 申请日期 2005.12.28
申请人 UNITED MICROELECTRONICS CORP. 发明人 LIN CHIN-HSIANG;LIU CHIH-CHIEN
分类号 H01L23/48;H01L23/52;H01L29/40 主分类号 H01L23/48
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