发明名称 System and method for optical interrogation of micro-mechanical sensors using microcavity interferometry
摘要 A sensor and a method for sensing a change in mass of a reflective microbeam in a sensor, the sensor having a reflective layer disposed on a substrate and spaced apart from the reflective microbeam. The microbeam receives amplitude modulated laser energy at a first wavelength and is photothermally excited into resonance at the frequency of amplitude modulation, the reflective microbridge and the reflective layer receive optical energy at a second wavelength and reflect the optical energy toward a receiver. A change in reflectivity of the microbeam at different frequencies is determined. A change in reflectivity indicates a change in resonant frequency of the microbeam. Mass of the microbeam changes when a chemoselective material on the microbeam sorbs a target chemical.
申请公布号 US7673517(B2) 申请公布日期 2010.03.09
申请号 US20060559119 申请日期 2006.11.13
申请人 THE UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY OF THE NAVY 发明人 STIEVATER TODD H.;RABINOVICH WILLIAM S;HOUSER ERIC J;STEPNOWSKI STANLEY V.;MCGILL R ANDREW
分类号 G01N29/00 主分类号 G01N29/00
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