发明名称 Dummy gate structure for gate last process
摘要 A semiconductor device is provided which includes a semiconductor substrate having a first portion and a second portion, transistors formed in the first portion of the substrate, each transistor having a gate structure with a high-k dielectric and a metal gate, a device element formed in the second portion of the substrate, the device element being isolated by an isolation region, and a polishing stopper formed adjacent the isolation region and having a surface that is substantially planar with a surface of the gate structures of the transistors in the first region.
申请公布号 US2010052060(A1) 申请公布日期 2010.03.04
申请号 US20090455509 申请日期 2009.06.03
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 LAI SU-CHEN;WU MING-YUAN;THEI KONG-BENG;CHUANG HARRY HAK-LAY;YEH CHIUNG-HAN;CHANG HONG-DYI;CHENG KUO CHENG;WU CHIEN-HUNG;LEE TZUNG-CHI
分类号 H01L27/06;H01L21/77 主分类号 H01L27/06
代理机构 代理人
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