发明名称 RETICLE STAGE FOR MULTI-CORRECTING THE AMOUNT OF RETICLE ROTATION AND SHIFT IN EXPOSURE PROCESS AND MULTI-CORRECTING METHOD USING THEREOF
摘要 <p>PURPOSE: A reticle stage for a multi-correcting the amount of reticle rotation and a shift in exposure process and a multi-correcting method using thereof are provided to overcome limit of correction by correcting the amount of rotation and shift while being contacted to a first stage ad a reticle. CONSTITUTION: A reticle stage comprises a first stage(10) and a second stage(20). The first stage comprises a first adhesive unit(15). The first stage revolves in a horizontal direction. A first adhesive unit supports the reticle(1). The second stage comprises a second adhesive unit(25). The second adhesive unit passes through the first stage. The second adhesive unit supports the reticle.</p>
申请公布号 KR20100023191(A) 申请公布日期 2010.03.04
申请号 KR20080081827 申请日期 2008.08.21
申请人 DONGBU HITEK CO., LTD. 发明人 CHA, SUNG WHAN
分类号 H01L21/027 主分类号 H01L21/027
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