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发明名称
Vorrichtung zur Überprüfung von Leiterplatten, Verfahren zur Parametereinstellung und Vorrichtung zur Parametereinstellung
摘要
申请公布号
DE602006011678(D1)
申请公布日期
2010.03.04
申请号
DE200660011678T
申请日期
2006.06.21
申请人
OMRON CORP.
发明人
MORIYA, TOSHIHIRO;NAKAJIMA, AKIRA;SHIMIZU, ATSUSHI;ONISHI, TAKAKO;WADA, HIROTAKA
分类号
G01N21/956;G06T7/00
主分类号
G01N21/956
代理机构
代理人
主权项
地址
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