发明名称 Method For Polishing A Semiconductor Wafer
摘要 Semiconductor wafers are CMP polished by polishing the rear side of the semiconductor wafer by means of CMP with a material removal with a profile along the diameter of the wafer wherein material removal is higher at the center than at the edge of the rear side; and polishing the front side of the wafer by means of CMP with a material removal with a profile along the diameter of the wafer wherein material removal is lower in the center of the front side than in an edge region of the front side.
申请公布号 US2010056027(A1) 申请公布日期 2010.03.04
申请号 US20090542920 申请日期 2009.08.18
申请人 SILTRONIC AG 发明人 ZAPILKO CLEMENS;JAESCHKE THOMAS;TABATA MAKOTO;ROETTGER KLAUS
分类号 B24B1/00;B24B7/17 主分类号 B24B1/00
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