发明名称 SELECTIVE GROWTH OF POLYCRYSTALLINE SILICON-CONTAINING SEMICONDUCTOR MATERIAL ON A SILICON-CONTAINING SEMICONDUCTOR SURFACE
摘要 A method of depositing polycrystalline silicon exclusively on monocrystalline first silicon surface portions of a substrate surface which besides the first surface portions additionally has insulator surface portions, comprising the steps of depositing boron on the first silicon surface portions in an amount which in relation to the first silicon surface portions respectively corresponds to more than a monolayer of boron, and depositing silicon on the first silicon surface portions treated in that way.
申请公布号 US2010055880(A1) 申请公布日期 2010.03.04
申请号 US20080449335 申请日期 2008.02.15
申请人 TILLACK BERND L;HEINEMANN BERND;YAMAMOTO YUJI 发明人 TILLACK BERND L.;HEINEMANN BERND;YAMAMOTO YUJI
分类号 H01L21/20 主分类号 H01L21/20
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