发明名称 SPECIMEN ROUGHNESS DETECTING METHOD, AND APPARATUS FOR THE METHOD
摘要 <p>A minute roughness formed on a specimen surface is detected to improve the precision of an appearance inspection.  The detection target face of the side wall (21) of a tire (20) is irradiated with a red slit light from a first projection means (11) arranged in the direction of 45 degrees with respect to a normal line of the detection target face.  The detection target face is irradiated with a blue slit light from a second projection means (12) arranged in the direction of 45 degrees with respect to the normal line.  The irradiated face is photographed from the direction of the normal line by a line camera (13).  An R-component image and a B-component image are formed from the original photograph image, so that the individual luminance distribution waveforms thereof are determined.  The roughness formed on the detection target face is detected on the basis of the luminance distribution waveform.</p>
申请公布号 WO2010024254(A1) 申请公布日期 2010.03.04
申请号 WO2009JP64795 申请日期 2009.08.25
申请人 KABUSHIKI KAISHA BRIDGESTONE;SEKIGUCHI TOSHIKATSU 发明人 SEKIGUCHI TOSHIKATSU
分类号 G01B11/30;G01N21/88 主分类号 G01B11/30
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