Probe card for electrical connection of circuit point of test device with e.g. microprocessor, has coupling circuit comprising adjustable delay line for adjusting running time of signal path between probe and card connector

摘要

The card has contact pads for detecting electrical potential for operation of a circuit. A set of probes (NB1-NB4) is arranged in a sample that corresponds to a sample of selected pads of each device under test (51). A coupling circuit sets a signal path between a probe and an assigned card connector (BC), which is connected with a circuit point (AC) of a test device (1). The coupling circuit comprises an adjustable delay line for adjusting running time of the signal path between the probe and the card connector.