发明名称 APPARATUS FOR MEASURING DIELECTROPHORETIC PROPERTIES
摘要 <P>PROBLEM TO BE SOLVED: To provide an apparatus for measuring dielectrophoretic properties, capable of stably measuring the dielectrophoretic properties. Ž<P>SOLUTION: The apparatus for measuring the dielectrophoretic properties 1 includes a pair of electrodes 5 and 6 spaced out in a horizontal direction; a voltage supply section 7 for supplying a high-frequency voltage to the electrodes 5 and 6 to form a high-frequency non-uniform electric field between the electrodes; a frequency adjusting section 7 for adjusting the frequency of the high-frequency voltage applied by the voltage supply section 7; and position measuring means 8 and 9 for measuring the vertical position of a measurement object which are particles supplied to between the electrodes. The pair of electrodes 5 and 6 is disposed so that the distance between opposed faces 5a and 6a thereof will be gradually narrowed, as going downward perpendicularly. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010048779(A) 申请公布日期 2010.03.04
申请号 JP20080215781 申请日期 2008.08.25
申请人 GUNMA UNIV;OLYMPUS CORP 发明人 HAKODA MASARU;HIBINO HIROKI;FUKUDA HIROSHI;SHIBA YOSHIAKI
分类号 G01N27/00;C12M1/42 主分类号 G01N27/00
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