| 摘要 |
The disclosure relates to a test apparatus for testing a circuit board. The circuit board includes a connector and a plurality of test points connected to the connector via a plurality of lines and the connector of the circuit board is connected to the plurality of lines via a plurality of corresponding signal pins. The test apparatus includes a circuit, a connector, a plurality of probes, and a tester. The circuit includes a plurality of test points and lines connecting to the test points correspondingly. The connector is coupled to the connector of the circuit board. The plurality of probes contact with the test points of the test apparatus. The tester sends test-signals to the connector of the circuit board via the lines correspondingly, receives test-information on the test points of the circuit board via the connectors, analyzes the test-information, and generates a test-result of the circuit board.
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