METHODS FOR FABRICATING NONVOLATILE MEMORY DEVICES
摘要
<p>PURPOSE: A methods for fabricating nonvolatile memory devices is provided to improve charge retention by reducing the charge loss of a memory region. CONSTITUTION: A non-volatile memory device comprises a charge trapping layer(120). The charge trapping layer is formed on the semiconductor substrate(100). The charge trapping layer comprises a memory region and an electric charge blocking region(130). The manufacturing method of the non-volatile memory device traps the electric charges in the electric charge blocking region. The electric charge blocking regions surrounds the memory region.</p>
申请公布号
KR20100023284(A)
申请公布日期
2010.03.04
申请号
KR20080081965
申请日期
2008.08.21
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
LEE, JU YUL;BAIK, SEUNG JAE;HWANG, KI HYUN;CHOI, SI YOUNG