发明名称 METHODS FOR FABRICATING NONVOLATILE MEMORY DEVICES
摘要 <p>PURPOSE: A methods for fabricating nonvolatile memory devices is provided to improve charge retention by reducing the charge loss of a memory region. CONSTITUTION: A non-volatile memory device comprises a charge trapping layer(120). The charge trapping layer is formed on the semiconductor substrate(100). The charge trapping layer comprises a memory region and an electric charge blocking region(130). The manufacturing method of the non-volatile memory device traps the electric charges in the electric charge blocking region. The electric charge blocking regions surrounds the memory region.</p>
申请公布号 KR20100023284(A) 申请公布日期 2010.03.04
申请号 KR20080081965 申请日期 2008.08.21
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, JU YUL;BAIK, SEUNG JAE;HWANG, KI HYUN;CHOI, SI YOUNG
分类号 H01L27/115 主分类号 H01L27/115
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