发明名称 FLASH MEMORY DEVICE AND METHOD OF MANUFACTURING THEREOF
摘要 <p>PURPOSE: A flash memory device and a method of manufacturing thereof are provided to a retention characteristic of a device by preventing the penetration of a poly-silicon into an internal organic film. CONSTITUTION: A flash memory device comprises a tunnel insulating layer(101), a floating gate film(102), a first protective film(103), a dielectric film(104), and a second protective film(105). The first and the second protective film are formed on a nitride film. A control gate film(106) and a metal gate film(107) are formed on the second protective film. A sealing film(109) is formed on the sidewall of the control gate film, the floating gate film, the first protective film, the dielectric film, and second protective film.</p>
申请公布号 KR20100023141(A) 申请公布日期 2010.03.04
申请号 KR20080081749 申请日期 2008.08.21
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JOO, KWANG CHUL
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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