发明名称 EXAMINATION JIG FOR PRINTED CIRCUIT BOARD
摘要 PURPOSE: A test jig for a printed circuit board is provided to be used regardless of a kind of printed circuit boards by selectively protruding a contact unit from a body according to the kind of printed circuit boards. CONSTITUTION: A test jig(130) includes a body and a plurality of contact units(150). A plurality of grooves is formed on the body. The contact unit is arranged on each groove and is selectively protruded from the groove to be electrically connected to a printed circuit board(100). The contact unit includes a test pin, an elastic unit, and a support unit. The elastic unit is arranged under the test pin to move the test pin up and down. The support unit is interposed between the test pin and the elastic unit to support the test pin.
申请公布号 KR20100022624(A) 申请公布日期 2010.03.03
申请号 KR20080081217 申请日期 2008.08.20
申请人 SAMSUNG ELECTRO-MECHANICS CO., LTD. 发明人 KIM, NAM YEOL;SEO, MYUNG CHUL;SHIN, SEUNG YUL;CHOI, CHANG KYU;LEE, SANG YUL;KIM, HYUNG JUN
分类号 H05K13/08;G01R31/02 主分类号 H05K13/08
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