PURPOSE: A test jig for a printed circuit board is provided to be used regardless of a kind of printed circuit boards by selectively protruding a contact unit from a body according to the kind of printed circuit boards. CONSTITUTION: A test jig(130) includes a body and a plurality of contact units(150). A plurality of grooves is formed on the body. The contact unit is arranged on each groove and is selectively protruded from the groove to be electrically connected to a printed circuit board(100). The contact unit includes a test pin, an elastic unit, and a support unit. The elastic unit is arranged under the test pin to move the test pin up and down. The support unit is interposed between the test pin and the elastic unit to support the test pin.
申请公布号
KR20100022624(A)
申请公布日期
2010.03.03
申请号
KR20080081217
申请日期
2008.08.20
申请人
SAMSUNG ELECTRO-MECHANICS CO., LTD.
发明人
KIM, NAM YEOL;SEO, MYUNG CHUL;SHIN, SEUNG YUL;CHOI, CHANG KYU;LEE, SANG YUL;KIM, HYUNG JUN