Laser-based apparatus for ultrasonic flaw detection

摘要

A surface inspecting device for inspecting a flaw of a test object (510) using a surface wave (SR) and estimating a depth of the flaw of the test object (510) from the attenuation ratio (±) of a frequency (f) of a generation wave (ST), the surface inspecting device comprising:
a unit configured to calculate a power spectrum (T(f)) of generation wave (ST) generating the flaw of the test object (510);
a unit configured to integrate the power spectrum (T(f)) of the generation wave generating the flaw of the test object and calculating an integration value (I) thereof;
a unit configured to collate the calculated integration value (I) by converting the integration value into a flaw depth for calibration created beforehand and
calculating the flaw depth of the test object (510); and
a unit configured to display the calculated flaw depth of the test object (510).