发明名称 Silicon wafer and method for producing the same
摘要 <p>A silicon wafer is produced through the steps of forming a silicon ingot by a CZ method with an interstitial oxygen concentration of not more than 7.0x10 17 atoms/cm 3 , slicing a wafer from the silicon ingot after doping the silicon ingot with phosphorus, forming a polysilicon layer or a strained layer on one main surface of the wafer, mirror polishing the other main surface of the wafer, and performing a heat treatment for the wafer in a non-oxidizing atmosphere.</p>
申请公布号 EP2159827(A2) 申请公布日期 2010.03.03
申请号 EP20090168544 申请日期 2009.08.25
申请人 SUMCO CORPORATION 发明人 UMENO, SHIGERU;NISHIMOTO, MANABU;HOURAI, MASATAKA
分类号 H01L21/261;C30B15/00;C30B29/06;H01L21/322;H01L21/331;H01L29/739 主分类号 H01L21/261
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