发明名称 |
Silicon wafer and method for producing the same |
摘要 |
<p>A silicon wafer is produced through the steps of forming a silicon ingot by a CZ method with an interstitial oxygen concentration of not more than 7.0x10 17 atoms/cm 3 , slicing a wafer from the silicon ingot after doping the silicon ingot with phosphorus, forming a polysilicon layer or a strained layer on one main surface of the wafer, mirror polishing the other main surface of the wafer, and performing a heat treatment for the wafer in a non-oxidizing atmosphere.</p> |
申请公布号 |
EP2159827(A2) |
申请公布日期 |
2010.03.03 |
申请号 |
EP20090168544 |
申请日期 |
2009.08.25 |
申请人 |
SUMCO CORPORATION |
发明人 |
UMENO, SHIGERU;NISHIMOTO, MANABU;HOURAI, MASATAKA |
分类号 |
H01L21/261;C30B15/00;C30B29/06;H01L21/322;H01L21/331;H01L29/739 |
主分类号 |
H01L21/261 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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