发明名称 METHOD FOR FABRICATING FINE PATTERN HAVING IRREGULAR WIDTH
摘要 PURPOSE: A method for fabricating fine pattern having irregular width is provided to improve operation property and production yield by adjusting the width of a gate pattern. CONSTITUTION: A gate line is formed through an exposure process. The line width of the gate pattern is changed. The exposure process uses the mask. The mask defines a main pattern and an assistant pattern. The main pattern has a line-shape with a specific width. The assistant pattern has a dot form. A wide part of a line width in the gate pattern is located on an active region(602). The width of the gate pattern is located on surface of the element isolation film(604).
申请公布号 KR20100022731(A) 申请公布日期 2010.03.03
申请号 KR20080081392 申请日期 2008.08.20
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE, JONG SU
分类号 H01L21/3205 主分类号 H01L21/3205
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