发明名称 Memory cell with built-in process variation tolerance
摘要 A Schmitt Trigger (ST) based, fully differential, 10-transistor (10T) SRAM (Static Random Access Memory) bitcell suitable for sub-threshold operation. The Schmitt trigger based bitcell achieves 1.56× higher read static noise margin (SNM) (VDD=400 mV) compared to a conventional 6T cell. The robust Schmitt trigger based memory cell exhibits built-in process variation tolerance that gives tight SNM distribution across the process corners. It utilizes fully differential operation and hence does not require any architectural changes from the present 6T architecture. The 10T bitcell has two cross-coupled Schmitt trigger inverters which each consist of four transistors, including a PMOS transistor and two NMOS transistors in series, and an NMOS feedback transistor which is connected between the inverter output and the junction between the series-connected NMOS transistors. Each inverter has one associated NMOS access transistor.
申请公布号 US7672152(B1) 申请公布日期 2010.03.02
申请号 US20080038314 申请日期 2008.02.27
申请人 PURDUE RESEARCH FOUNDATION 发明人 KULKARNI JAYDEEP P.;ROY KAUSHIK
分类号 G11C11/00 主分类号 G11C11/00
代理机构 代理人
主权项
地址