发明名称 Autofocus method for scanning charged-particle beam instrument
摘要 An autofocus method for bringing an electron beam into focus on a specimen. Characteristics of the brightness at plural kinds of focus values are found for sets of data. The characteristics are accumulated creating a focus function. The focus function is approximated by a quadratic curve. The focus value at the peak point is found from the quadratic curve. Based on the focus value, the focal condition of the beam is set.
申请公布号 US7671332(B2) 申请公布日期 2010.03.02
申请号 US20080117819 申请日期 2008.05.09
申请人 JEOL LTD. 发明人 INOKUCHI MASAYUKI
分类号 H01J37/21 主分类号 H01J37/21
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