发明名称 Substrate treating method, substrate-processing apparatus, developing method, method of manufacturing a semiconductor device, and method of cleaning a developing solution nozzle
摘要 There is disclosed a substrate treating method comprising supplying a treating solution onto a substrate, and continuously discharging a first cleaning solution to the substrate from a first discharge region disposed in a nozzle, while moving the nozzle and substrate with respect to each other in one direction, wherein a length of a direction crossing at right angles to the direction of the first discharge region is equal to or more than a maximum diameter or longest side of the substrate, the nozzle continuously spouts a first gas to the substrate from a first jet region, and the length of a direction crossing at right angles to the direction of the first jet region is equal to or more than the maximum diameter or longest side of the substrate.
申请公布号 US7669608(B2) 申请公布日期 2010.03.02
申请号 US20040988639 申请日期 2004.11.16
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 HAYASAKI KEI;ITO SHINICHI;EMA TATSUHIKO;TAKAHASHI RIICHIRO
分类号 B08B3/00;H01L21/027;G03F7/30;H01L21/311 主分类号 B08B3/00
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