发明名称 Lithographic apparatus having masking parts and device manufacturing method
摘要 A lithographic apparatus includes a masking device that includes a first masking part configured to obscure a first part of a first patterning device before the pattern of the first patterning device is impinged by a radiation beam, a second masking part having an adjustable length, the second masking part configured to obscure a second part of the first patterning device after the pattern of the first patterning device is impinged by the radiation beam and to obscure a first part of a second patterning device before the pattern of the second patterning device is impinged by the radiation beam, and a third masking part configured to obscure a second part of the second patterning device after the pattern of the second patterning device is impinged by the radiation beam.
申请公布号 US7671968(B2) 申请公布日期 2010.03.02
申请号 US20060486378 申请日期 2006.07.14
申请人 ASML NETHERLANDS B.V. 发明人 LOOPSTRA ERIK ROELOF;BLEEKER ARNO JAN;MULDER HEINE MELLE;NOORDMAN OSCAR FRANCISCUS JOZEPHUS;SENGERS TIMOTHEUS FRANCISCUS;JORRITSMA LAURENTIUS CATRINUS;TRENTELMAN MARK;STREUTKER GERRIT
分类号 G03B27/72 主分类号 G03B27/72
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