发明名称 |
Circuit and method for providing PCB power-on self test capability for peripheral devices |
摘要 |
A circuit and method for providing a power-on self test capability for peripheral devices that allows direct testing of address-line data. The preferred embodiment includes a multiplexer circuit that allows the read address line outputs of a microprocessor to be directly returned to the data inputs of the microprocessor, thus providing a direct verification of the integrity of the read-address connection.
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申请公布号 |
US7673177(B2) |
申请公布日期 |
2010.03.02 |
申请号 |
US20030611272 |
申请日期 |
2003.07.01 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
HURLEY WILLIAM M. |
分类号 |
G06F11/00;H02H3/05 |
主分类号 |
G06F11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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