发明名称 Circuit and method for providing PCB power-on self test capability for peripheral devices
摘要 A circuit and method for providing a power-on self test capability for peripheral devices that allows direct testing of address-line data. The preferred embodiment includes a multiplexer circuit that allows the read address line outputs of a microprocessor to be directly returned to the data inputs of the microprocessor, thus providing a direct verification of the integrity of the read-address connection.
申请公布号 US7673177(B2) 申请公布日期 2010.03.02
申请号 US20030611272 申请日期 2003.07.01
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HURLEY WILLIAM M.
分类号 G06F11/00;H02H3/05 主分类号 G06F11/00
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