发明名称 Stage apparatus with two patterning devices, lithographic apparatus and device manufacturing method skipping an exposure field pitch
摘要 In order to improve the productivity of a lithographic apparatus, a stage apparatus for holding two patterning devices is described. The patterning devices are arranged such that the distance between the patterns in the scanning direction corresponds to the length of the pattern in the scanning direction. By doing so, an improved exposure sequence may be performed by exposing a first die with a first pattern, skipping a second die adjacent to the first die, and exposing a third die adjacent to the second die using a second pattern.
申请公布号 US7671970(B2) 申请公布日期 2010.03.02
申请号 US20060335715 申请日期 2006.01.20
申请人 ASML NETHERLANDS B.V. 发明人 LOOPSTRA ERIK ROELOF
分类号 G03B27/62 主分类号 G03B27/62
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