发明名称 Methods of forming contact openings
摘要 The present invention is directed to methods of forming contact openings. In one illustrative embodiment, the method includes forming a feature above a semiconducting substrate, forming a layer stack comprised of a plurality of layers of material above the feature, the layer stack having an original height, reducing the original height of the layer stack to thereby define a reduced height layer stack above the feature, forming an opening in the reduced height layer stack for a conductive member that will be electrically coupled to the feature and forming the conductive member in the opening in the reduced height layer stack.
申请公布号 US7670938(B2) 申请公布日期 2010.03.02
申请号 US20060381219 申请日期 2006.05.02
申请人 GLOBALFOUNDRIES, INC. 发明人 WU DAVID D.;MICHAEL MARK W.
分类号 H01L21/44 主分类号 H01L21/44
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